DocumentCode :
739566
Title :
Transverse Mode Spurious Resonance Suppression in Lamb Wave MEMS Resonators: Theory, Modeling, and Experiment
Author :
Hongxiang Zhang ; Ji Liang ; Xiaoyan Zhou ; Hao Zhang ; Daihua Zhang ; Wei Pang
Author_Institution :
State Key Lab. of Precision Meas. Technol. & Instrum., Tianjin Univ., Tianjin, China
Volume :
62
Issue :
9
fYear :
2015
Firstpage :
3034
Lastpage :
3041
Abstract :
This paper presents a transverse mode suppression theory and its experimental verification through aluminum nitride Lamb wave resonators (LWRs) operating at 142 MHz. An effective 2-D approximation model of the LWR is proposed, based on which the origin of transverse modes in LWR is investigated. The displacement distribution, resonant frequencies, and electromechanical coupling coefficients (k2t) of the main mode and its auxiliary transverse modes are obtained. A spurious mode suppression theory in terms of the expression of k2t in the 2-D model is proposed. Three kinds of electrodes are designed to suppress the transverse mode adjacent to the main mode, including a novel interdigital transducer gap technique that is reported for the first time. With the applicable geometries, these methods reduce the spurious response from 11.8 to <;0.5 dB, without significantly affecting the figure of merit of the resonator.
Keywords :
aluminium compounds; interdigital transducers; micromechanical resonators; surface acoustic waves; 2-D approximation model; LWR; Lamb wave MEMS resonator; aluminum nitride; auxiliary transverse mode; displacement distribution; electromechanical coupling coefficient; experimental verification; figure of merit; frequency 142 MHz; interdigital transducer gap technique; microelectromechanical system; resonant frequency; spurious mode suppression theory; transverse mode spurious resonance suppression; Acoustic waves; Aluminum nitride; Apertures; Cavity resonators; Electrodes; III-V semiconductor materials; Resonant frequency; Aluminum nitride (AlN); Lamb wave resonator (LWR); micro electromechanical system (MEMS); spurious mode suppression; spurious mode suppression.;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2015.2458913
Filename :
7177076
Link To Document :
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