Title :
Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study
Author :
Kaneko, Nobu-hisa ; Oe, Takehiko ; Wan-Seop Kim ; Dong-Hun Chae ; Elmquist, Randolph ; Kraft, Marlin
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Nat. Metrol. Inst. of Japan, Tsukuba, Japan
Abstract :
The transportation effect and other important characteristics of 100 Ω standard resistors of a new construction have been studied. For the transportation effect, four resistors have been transported by air between three national metrology institutes (NMIs): 1) the Korea Research Institute of Standards and Science; 2) the National Institute of Standards and Technology in the USA; and 3) the National Metrology Institute of Japan. Two of the resistors have been transported in hand-carried luggage and the other two by normal air freight. Resistance values as well as other characteristics have been carefully evaluated before and after the transportation to the NMIs. The measurements were done by means of their primary national standards based on the quantum Hall effect. No noticeable difference between the two transportation methods has been detected within a standard uncertainty of 0.01 μQ/Q. Other characteristics, the drift rate: about 0.05 (μQ/Q)/year or less, temperature coefficient: about 0.02 (μQ/Q)/°C or less, and power coefficient: negligible, have also been reported. It is demonstrated that this excellent performance is suitable for utilization in NMIs and international comparisons.
Keywords :
electric resistance measurement; measurement uncertainty; quantum Hall effect; resistors; transfer standards; hand carried luggage; international trilateral pilot study; metal-foil resistor; national metrology institutes; quantum Hall effect; resistance 100 ohm; standard resistors; standard uncertainty; transportation effect; Electrical resistance measurement; Resistance; Resistors; Standards; Temperature measurement; Transportation; Wires; International comparison; quantum Hall effect; resistance standard; standard resistor; transportation effect; transportation effect.;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2015.2399013