Author : 
Dupuis, Nicolas ; Lee, Benjamin G. ; Rylyakov, Alexander V. ; Kuchta, Daniel M. ; Baks, Christian W. ; Orcutt, Jason S. ; Gill, Douglas M. ; Green, William M. J. ; Schow, Clint L.
         
        
            Author_Institution : 
IBM T. J. Watson Research Center, Yorktown Heights, NY, USA