DocumentCode :
740115
Title :
Normally-off vertical-type mesa-gate GaN MOSFET
Author :
Chul-Ho Won ; Ki-Won Kim ; Dong-Seok Kim ; Hee-Sung Kang ; Ki-Sik Im ; Young-Woo Jo ; Do-Kywn Kim ; Ryun-Hwi Kim ; Jung-Hee Lee
Author_Institution :
Sch. of Electron. Eng., Kyungpook Nat. Univ., Daegu, South Korea
Volume :
50
Issue :
23
fYear :
2014
Firstpage :
1749
Lastpage :
1751
Abstract :
A vertical-type mesa-gate GaN metal-oxide semiconductor field-effect transistor (MOSFET) has been fabricated. The mesa-gate structure can be easily achieved by a single deep etch to the n+-GaN which is the drain of the device, whereas the trench-gate structure, the commonly used structure for the vertical-type MOSFETs, requires an additional etching process to define the gate region. The mesa-gate GaN MOSFET exhibited a normally-off operation with the threshold voltage of 3 V, a normalised drain current of ~ 55 mA/mm and a high on/off current ratio of 108.
Keywords :
III-V semiconductors; MOSFET; etching; gallium compounds; wide band gap semiconductors; GaN; n+-GaN; normalised drain current; normally-off vertical-type mesa-gate MOSFET; on/off current ratio; single deep etch; threshold voltage; trench-gate structure; vertical-type mesa-gate metal-oxide semiconductor field-effect transistor; voltage 3 V;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2014.1692
Filename :
6955130
Link To Document :
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