Title :
EMI susceptibility: The achilles´ heel of smart power ICs
Author_Institution :
Electron. & Telecommun. Dept., Politec. di Torino, Turin, Italy
Abstract :
In this paper the main causes of failures induced by radio frequency interference in elementary integrated circuits (ICs) are summarized, then more complex devices like smart power ICs are considered and a method to evaluate their susceptibility to such disturbances is presented. The weakness of smart power ICs against radio frequency interference is highlighted referring to the results of measurements carried out on a test chip composed of a power MOS and an analog block both integrated in the same silicon die but electrically isolated one to each other.
Keywords :
electromagnetic interference; elemental semiconductors; power MOSFET; power integrated circuits; silicon; EMI susceptibility; Si; achilles heel; analog block; elementary integrated circuits; power MOS; silicon die; smart power integrated circuit; Integrated circuits; Interference; Logic gates; MOSFET; Radio frequency; Radio frequency interference; analog circuits; electromagnetic compatibility; electromagnetic susceptibility; smart power integrated circuits; substrate coupling;
Journal_Title :
Electromagnetic Compatibility Magazine, IEEE
DOI :
10.1109/MEMC.2015.7204059
