• DocumentCode
    740334
  • Title

    Characterisation of ferroelectric poly(vinylidene fluoride–trifluoroethylene) film prepared by Langmuir-Blodgett deposition

  • Author

    Woo Young Kim ; Dong-Seok Song ; Gwang-Jae Jeon ; In Ku Kang ; Hyun Bin Shim ; Do-Kyung Kim ; Hee Chul Lee ; Hongsik Park ; Shin-Won Kang ; Jin-Hyuk Bae

  • Author_Institution
    Dept. of Mech. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • Volume
    10
  • Issue
    8
  • fYear
    2015
  • Firstpage
    384
  • Lastpage
    388
  • Abstract
    Ferroelectric polymer is a flexible memory material that is insensitive to environmental variations and lends itself to research in emerging optoelectronic applications. Using Langmuir-Blodgett (LB) deposition technology, the thickness of a ferroelectric film can be controlled in the nanometre range, offering a pathway to molecular electronics. In this reported work, ultrathin ferroelectric polymer films were fabricated through LB deposition technology and characterised by observing the surface morphology, crystallinity and polarisation-voltage relationships. Unlike previously reported ferroelectric LB films, this work has shown a maximum remanent polarisation (PR) of 6 μC/cm2 at 35 nm, which is compatible with the thick film prepared by the spin-coating method. In addition, the polarisation stability in terms of depolarisation was investigated, which showed that the engineering of the interface between the ferroelectric LB film and the substrate is an important, deterministic factor for reliable memory applications with high signal-to-noise ratios.
  • Keywords
    Langmuir-Blodgett films; dielectric depolarisation; dielectric polarisation; ferroelectric materials; ferroelectric thin films; ferroelectricity; polymer films; surface morphology; Langmuir-Blodgett deposition; crystallinity; dielectric depolarisation; ferroelectric poly(vinylidene fluoride-trifluoroethylene) film; flexible memory material; polarisation stability; polarisation-voltage relationships; reliable memory applications; remanent polarisation; signal-to-noise ratios; surface morphology; ultrathin ferroelectric polymer films;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2015.0038
  • Filename
    7206843