DocumentCode :
740401
Title :
A Stochastic Approach for the Analysis of Dynamic Fault Trees With Spare Gates Under Probabilistic Common Cause Failures
Author :
Peican Zhu ; Jie Han ; Leibo Liu ; Lombardi, Fabrizio
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
Volume :
64
Issue :
3
fYear :
2015
Firstpage :
878
Lastpage :
892
Abstract :
A redundant system usually consists of primary and standby modules. The so-called spare gate is extensively used to model the dynamic behavior of redundant systems in the application of dynamic fault trees (DFTs). Several methodologies have been proposed to evaluate the reliability of DFTs containing spare gates by computing the failure probability. However, either a complex analysis or significant simulation time are usually required by such an approach. Moreover, it is difficult to compute the failure probability of a system with component failures that are not exponentially distributed. Additionally, probabilistic common cause failures (PCCFs) have been widely reported, usually occurring in a statistically dependent manner. Failure to account for the effect of PCCFs overestimates the reliability of a DFT. In this paper, stochastic computational models are proposed for an efficient analysis of spare gates and PCCFs in a DFT. Using these models, a DFT with spare gates under PCCFs can be efficiently evaluated. In the proposed stochastic approach, a signal probability is encoded as a non-Bernoulli sequence of random permutations of fixed numbers of ones and zeros. The component´s failure probability is not limited to an exponential distribution, thus this approach is applicable to a DFT analysis in a general case. Several case studies are evaluated to show the accuracy and efficiency of the proposed approach, compared to both an analytical approach and Monte Carlo (MC) simulation.
Keywords :
Monte Carlo methods; fault trees; DFT; Monte Carlo simulation; PCCF; component failure probability; dynamic fault trees analysis; exponential distribution; failure probability; probabilistic common cause failures; random permutations; signal probability; spare gates; stochastic approach; stochastic computational models; Computational modeling; Discrete Fourier transforms; Fault trees; Hazards; Logic gates; Stochastic processes; Switches; Dynamic fault tree; cold spare gate; hot spare gate; non-Bernoulli sequence; probabilistic common cause failure; reliability analysis; stochastic computation; stochastic logic; warm spare gate;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2015.2419214
Filename :
7094318
Link To Document :
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