• DocumentCode
    740688
  • Title

    International integrated reliability workshop

  • Volume
    36
  • Issue
    9
  • fYear
    2015
  • Firstpage
    984
  • Lastpage
    984
  • Abstract
    Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2470875
  • Filename
    7217873
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=740688