DocumentCode
740897
Title
Achievement of Large Normalized Delay Bandwidth Product by Exciting Electromagnetic-Induced Transparency in Plasmonic Waveguide
Author
Zafar, Rukhsar ; Salim, Mohammad
Author_Institution
Department of Electronics and Communication Engineering, Malviya National Institute of Technology, Jaipur, India
Volume
51
Issue
10
fYear
2015
Firstpage
1
Lastpage
6
Abstract
In this paper, we have generated an effect of electromagnetic-induced transparency (EIT)-like transmission in a pair of resonators coupled to a metal–insulator–metal waveguide. Resonators are separated by the metallic nanoslit. By controlling single parameter (i.e., the width of the metallic slit), the device is made to exhibit EIT-like transmission. EIT is the result of destructive interference between two resonating modes, which leads to an asymmetrical-shaped resonance called Fano resonance. EIT is generally accompanied with sharp dispersion that reduces the velocity of light near the resonance. The slow-light characteristics of the device are also investigated. An ultra large value of group index (
) and a large value of normalized delay bandwidth product (NDBP = 0.88) is obtained over an ultra large bandwidth (
THz). Furthermore, it is theoretically predicted that asymmetry parameter (
) of Fano resonance experiences a sign reversal when resonances are swept each other in the tuning process. This reversible Fano resonance and slow-light nature of proposed device open up the avenues for designing on-chip optical buffers, switches, modulators, and so on.
Keywords
Bandwidth; Couplings; Optical buffering; Optical resonators; Optical waveguides; Plasmons; Resonant frequency; Asymmetry parameter; Electromagnetic Induced Transparency; Electromagnetic induced transparency; Fano resonance; Group index; Metal- Insulator-metal (MIM); Normalized Delay Bandwidth Product; asymmetry parameter; group index; metalinsulator-metal (MIM); normalized delay bandwidth product;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2015.2472979
Filename
7225099
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