New approach to evaluate area-dependent breakdown characteristics of dielectric polymer films

A new dielectric breakdown measurement method for determining breakdown characteristics of polymer films has been developed and evaluated. The method is based on measurement of multiple breakdowns per sample area beyond the weakest point of the film by utilizing low-energy self-healing breakdown of metallized polymer film. A data selection process based on the discharge energy characteristics of each measured self-healing breakdown is utilized prior to the statistical analysis in order to validate the mutual independence of the results. Even with a relatively small sample area, the method yields a large amount of breakdown data from a wide voltage spectrum, thus enabling the formation of detailed material-specific breakdown fingerprints. The measurement system and the area dependence of the breakdown results have been evaluated with capacitor-grade metallized film. For the statistical analysis, additively mixed Weibull distributions are utilized as multiple breakdown mechanisms are found to be operative in the dielectric. Defects in the dielectric volume are found to have a profound effect on the structure of the mixed distribution with increasing area.