Title :
Foreword for the Special Issue on Active MOSFET Clamps for ESD Protection of Advanced CMOS Technologies
Author :
Boselli, Gianluca
Abstract :
The papers in this special issue focus on the use of MOSFET clamps for ESD protection of advanced CMOS technologies.
Keywords :
CMOS integrated circuits; CMOS technology; Clamps; Electrostatic discharges; MOSFET; Semiconductor diodes; Special issues and sections;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2015.2468371
