Open- and Short-Circuit Switch Fault Diagnosis for Nonisolated DC–DC Converters Using Field Programmable Gate Array

Fault detection (FD) in power electronic converters is necessary in embedded and safety critical applications to prevent further damage. Fast FD is a mandatory step in order to make a suitable response to a fault in one of the semiconductor devices. The aim of this study is to present a fast yet robust method for fault diagnosis in nonisolated dc-dc converters. FD is based on time and current criteria which observe the slope of the inductor current over the time. It is realized by using a hybrid structure via coordinated operation of two FD subsystems that work in parallel. No additional sensors, which increase system cost and reduce reliability, are required for this detection method. For validation, computer simulations are first carried out. The proposed detection scheme is validated on a boost converter. Effects of input disturbances and the closed-loop control are also considered. In the experimental setup, a field programmable gate array digital target is used for the implementation of the proposed method, to perform a very fast switch FD. Results show that, with the presented method, FD is robust and can be done in a few microseconds.