Title :
Hop-Diffusion Monte Carlo for Epipolar Geometry Estimation between Very Wide-Baseline Images
Author :
Brahmachari, A.S. ; Sarkar, Santonu
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
fDate :
3/1/2013 12:00:00 AM
Abstract :
We present a Monte Carlo approach for epipolar geometry estimation that efficiently searches for minimal sets of inlier correspondences in the presence of many outliers in the putative correspondence set, a condition that is prevalent when we have wide baselines, significant scale changes, rotations in depth, occlusion, and repeated patterns. The proposed Monte Carlo algorithm uses Balanced LOcal and Global Search (BLOGS) to find the best minimal set of correspondences. The local search is a diffusion process using Joint Feature Distributions that captures the dependencies among the correspondences. And, the global search is a hopping search process across the minimal set space controlled by photometric properties. Using a novel experimental protocol that involves computing errors for manually marked ground truth points and images with outlier rates as high as 90 percent, we find that BLOGS is better than related approaches such as MAPSAC [1], NAPSAC [2], and BEEM [3]. BLOGS results are of similar quality as other approaches, but BLOGS generate them in 10 times fewer iterations. The time per iteration for BLOGS is also the lowest among the ones we studied.
Keywords :
Monte Carlo methods; geometry; image processing; iterative methods; search problems; BLOGS; balanced local and global search; epipolar geometry estimation; hop-diffusion Monte Carlo algorithm; hopping search process; inlier correspondences; iteration algorithm; joint feature distributions; marked ground truth points; minimal set space; novel experimental protocol; photometric properties; putative correspondence set; very wide-baseline images; Blogs; Estimation; Geometry; Joints; Linear programming; Monte Carlo methods; Proposals; Epipolar geometry; Joint Feature Distribution (JFD); Markov Chain Monte Carlo (MCMC);
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2012.227