• DocumentCode
    742123
  • Title

    Graphene Field-Effect Transistors Based on Boron–Nitride Dielectrics

  • Author

    Meric, Inanc ; Dean, C.R. ; Petrone, Nicholas ; Lei Wang ; Hone, James ; Kim, Peter ; Shepard, Kenneth L.

  • Author_Institution
    Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
  • Volume
    101
  • Issue
    7
  • fYear
    2013
  • fDate
    7/1/2013 12:00:00 AM
  • Firstpage
    1609
  • Lastpage
    1619
  • Abstract
    Two-dimensional atomic sheets of graphene represent a new class of nanoscale materials with potential applications in electronics. However, exploiting the intrinsic characteristics of graphene devices has been problematic due to impurities and disorder in the surrounding dielectric and graphene/dielectric interfaces. Recent advancements in fabricating graphene heterostructures by alternately layering graphene with crystalline hexagonal boron nitride (hBN), its insulating isomorph, have led to an order of magnitude improvement in graphene device quality. Here, recent developments in graphene devices utilizing boron-nitride dielectrics are reviewed. Field-effect transistor (FET) characteristics of these systems at high bias are examined. Additionally, existing challenges in material synthesis and fabrication and the potential of graphene/BN heterostructures for novel electronic applications are discussed.
  • Keywords
    boron compounds; dielectric devices; field effect transistors; graphene; impurities; nanoelectronics; FET characteristics; boron-nitride dielectrics; crystalline hexagonal boron nitride; electronic application; graphene device intrinsic characteristics; graphene device quality; graphene field-effect transistor; graphene heterostructure; graphene/BN heterostructure fabrication; graphene/dielectric interface; impurity; insulating isomorph; layering graphene; magnitude improvement; material synthesis; nanoscale material; two-dimensional atomic sheet; Conductivity; Dielectric measurement; Dielectrics; Field effect transistors; Graphene; Logic gates; Temperature measurement; Transistors; Graphene field-effect transistors (GFETs); hexagonal boron nitride (hBN);
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2013.2257634
  • Filename
    6516044