Title :
366-kS/s 1.09-nJ 0.0013-mm2 Frequency-to-Digital Converter Based CMOS Temperature Sensor Utilizing Multiphase Clock
Author :
Kisoo Kim ; Hokyu Lee ; Chulwoo Kim
Author_Institution :
Dept. of Electr. Eng., Korea Univ., Seoul, South Korea
Abstract :
A smart temperature sensor in 65-nm CMOS, utilizing CMOS ring oscillators, consumes 1.09 nJ at a conversion rate of 366 kS/s. This is achieved by the direct temperature-to-digital conversion method implemented in the frequency-to-digital converter. The algorithm utilized in the fine code generator makes it possible to increase the resolution of the sensor efficiently. Compared to previous work, this brief shows lower VDD operation. After one point calibration, the chip-to-chip spread is +2.7 ~ -2.9°C over the temperature range of -40°C to 110°C.
Keywords :
CMOS integrated circuits; analogue-digital conversion; clocks; temperature sensors; CMOS ring oscillators; CMOS temperature sensor; calibration; chip-to-chip spread; direct temperature-to-digital conversion; energy 1.09 nJ; fine code generator; frequency-to-digital converter; multiphase clock; size 65 nm; smart temperature sensor; temperature -40 degC to 110 degC; CMOS integrated circuits; Clocks; Frequency conversion; Radiation detectors; Ring oscillators; Temperature measurement; Temperature sensors; Compensation; PVT variation; frequency-to-digital converter; oscillator; temperature sensor;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2012.2220389
