Title :
A Reconfigurable and Power-Scalable 10–12 Bit 0.4–44 MS/s Pipelined ADC With 0.35–0.5 pJ/Step in 1.2 V 90 nm Digital CMOS
Author :
Taherzadeh-Sani, Mohammad ; Hamoui, Anas A.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
A pipelined ADC, reconfigurable over bandwidths of 0.2-22 MHz (sampling frequencies of 0.4-44 MS/s) and resolutions of 10-12 bits, is described for applications in multi-standard wireless terminals. Fabricated in a 1.2-V 90-nm digital CMOS technology, this ADC achieves low power (figure-of-merit of FOM=0.35 to 0.5 pJ per A/D conversion step) over its full bandwidth-resolution range. Accordingly, compared to state-of-the-art power-efficient reconfigurable pipelined ADCs, this ADC provides a larger bandwidth-resolution reconfigurability space, while maintaining a highly competitive FOM over this entire space. To achieve such low-power performance in a low-voltage nanometer CMOS process, this work utilizes: (1) a current-scalable frequency-compensation technique to design low-power current-scalable two-stage opamps; (2) a switched-capacitor technique to design dynamic comparators with low input capacitance (input-loading effect); and (3) a low-power digital background gain-calibration technique. The large bandwidth and resolution reconfigurability ranges are achieved using current-scaling and stage-bypass techniques, respectively.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; comparators (circuits); low-power electronics; nanoelectronics; operational amplifiers; switched capacitor networks; FOM; bandwidth 0.2 MHz to 22 MHz; bandwidth-resolution reconfigurability space; current-scalable frequency-compensation technique; current-scaling techniques; digital CMOS technology; dynamic comparator design; figure-of-merit; low-power current-scalable two-stage operational amplifier; low-power digital background gain-calibration technique; low-voltage nanometer CMOS process; multistandard wireless terminals; power-efficient reconfigurable pipelined ADC; power-scalable pipelined ADC; size 90 nm; stage-bypass techniques; switched-capacitor technique; voltage 1.2 V; word length 10 bit to 12 bit; Bandwidth; Calibration; Capacitance; Capacitors; Pipelines; Power demand; Threshold voltage; Analog-to-digital (A/D) conversion; digital background calibration; low power; pipelined; power scalable; reconfigurable;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2012.2215712