DocumentCode
742551
Title
McPAT-PVT: Delay and Power Modeling Framework for FinFET Processor Architectures Under PVT Variations
Author
Aoxiang Tang ; Yang Yang ; Chun-Yi Lee ; Jha, Niraj K.
Author_Institution
Dept. of Electr. Eng., Princeton Univ., Princeton, NJ, USA
Volume
23
Issue
9
fYear
2015
Firstpage
1616
Lastpage
1627
Abstract
As technology has moved into the deep-submicrometer regime, the shrinking feature size has placed a considerable stress on CMOS fabrication due to short-channel effects (SCEs) and excessive leakage. Although many research efforts have been devoted to seeking system-level solutions, underlying transistor-level solutions are still urgently required to overcome these obstacles. FinFETs have emerged as promising substitutes for conventional CMOS due to their superior control of SCEs and process scalability. However, FinFETs still face lithographic and workfunction engineering challenges, in addition to those posed by supply voltage and temperature variations across the integrated circuit (IC). These lead to process, supply voltage, and temperature (PVT) variations in FinFET ICs, which, in turn, lead to large spreads in delay and leakage. In this paper, we present a multicore power, area, and timing (McPAT)-PVT, an integrated framework for the simulation of power, delay, as well as PVT variations of FinFET-based processors. McPAT-PVT uses a FinFET design library, consisting of logic and memory cells, to model circuit-level characteristics as well as their PVT variation trends. It is based on macromodels, derived from very accurate TCAD device simulations that characterize various functional units in a processor under PVT variations, making yield analysis for timing and power for processor components possible. McPAT-PVT can model both shorted-gate (SG) and asymmetric-workfunction shorted-gate (ASG) FinFET-based processors. Combining these macromodels with a FinFET-based CACTI-PVT cache model and an ORION-PVT on-chip network model, McPAT-PVT is able to simulate a delay and power consumption of all processor components under PVT variations. We present extensive simulation results to demonstrate its efficacy, including for an alpha-like processor and multicore simulations based on Princeton Application Repository for Shared-Memory Computers benchmarks. Results show that the- ASG FinFET-based processor implementation has 73× lower leakage power and 2.6× lower total power relative to the SG FinFET-based processor implementation for the same performance, with <;1% area penalty.
Keywords
CMOS integrated circuits; MOSFET; discrete event simulation; semiconductor device models; CMOS fabrication; FinFET design library; FinFET processor architectures; McPAT-PVT; asymmetric-workfunction shorted-gate; delay modeling framework; logic cells; memory cells; power modeling framework; short-channel effects; Delays; FinFETs; Integrated circuit modeling; Libraries; Logic gates; Power demand; FinFETs; McPAT-PVT; PVT variations; processor simulation; statistical analysis; yield analysis;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2014.2352354
Filename
6898862
Link To Document