DocumentCode :
742583
Title :
Measurements of Endurance Time for Electrostatic Discharge of Spacecraft Materials: A Defect-Driven Dynamic Model
Author :
Andersen, Allen ; Dennison, John Robert ; Sim, Alec M. ; Sim, Charles
Author_Institution :
Department of PhysicsMaterials Physics Group, Utah State University, Logan, UT, USA
Volume :
43
Issue :
9
fYear :
2015
Firstpage :
2941
Lastpage :
2953
Abstract :
Electrostatic breakdown leads to the majority of anomalies and failures attributed to spacecraft interactions with the plasma space environment. It is therefore critical to understand how the electrostatic field strength ( F_{{ESD}} ) of spacecraft materials varies due to environmental conditions, such as duration of applied electric field, rate of field change, history of exposure to high fields, and temperature. We have developed a dual-defect, thermodynamic, mean-field trapping model in terms of recoverable and irrecoverable defect modes to predict probabilities of breakdown. Fits to a variety of measurements of the dependence of F_{ {ESD}} of insulating polymers on endurance time, voltage ramp rate, and temperature based on this model yield consistent results. Our experimental results for the prototypical materials, low-density polyethylene and polymer (PI or Kapton HN), suggest that the values of F_{ {ESD}} from standard handbooks, or cursory measurements that have been used routinely in the past, substantially overestimate the field required for breakdown in common spacecraft applications, which often apply subcritical fields for very long time periods as charge accumulates.
Keywords :
Electrostatic discharges; Electrostatic measurements; Electrostatics; Temperature measurement; Time measurement; Voltage measurement; Arcing; breakdown; electrostatic discharge (ESD); polymers; space environment effects; spacecraft charging; spacecraft charging.;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2015.2428258
Filename :
7110395
Link To Document :
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