DocumentCode
742725
Title
Accelerated Dual-Path Asynchronous Circuit
Author
Tiben Che ; Jingwei Xu ; Gwan Choi
Author_Institution
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
Volume
62
Issue
9
fYear
2015
Firstpage
856
Lastpage
860
Abstract
This brief presents a novel design approach that accelerates an asynchronous circuit system by circumventing transient-fault-induced delays and tolerates latchups and other permanent faults. Specifically, a dual-path asynchronous circuit design and an associated arbiter are developed. Asynchronous circuits inherently tolerate transient errors by incurring an additional delay. This, in turn, can debilitate the circuit to suspend in an environment where the fault rate (FR) is excessively high. The dual-path design approach presented in this brief eliminates this problem by using whichever output or outcome combination becomes valid first from the two asynchronous stages. The design approach is illustrated with a low-density parity-check decoder architecture that must exhibit a high degree of reliability in error-prone operating conditions. Results show that the decoder reduces the delay overhead from 19.5% to 7.5% when the FR is 400/clock cycle. However, the arbiter only introduces about 2% area overhead in addition to the duplication overhead, which is exactly 2X.
Keywords
asynchronous circuits; decoding; error analysis; fault diagnosis; fault tolerance; parity check codes; transient analysis; accelerated dual-path asynchronous circuit; delay overhead production; dual-path design approach; error-prone operating condition; fault rate; latchup tolerance; low-density parity-check decoder; transient error; transient fault-induced delay; Asynchronous circuits; Circuit faults; Decoding; Delays; Protocols; Transient analysis; Asynchronous circuits; redundancy;
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2015.2436151
Filename
7111250
Link To Document