• DocumentCode
    742734
  • Title

    A Predetermined LMS Digital Background Calibration Technique for Pipelined ADCs

  • Author

    Montazerolghaem, Mohammad Ali ; Moosazadeh, Tohid ; Yavari, Mohammad

  • Author_Institution
    Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
  • Volume
    62
  • Issue
    9
  • fYear
    2015
  • Firstpage
    841
  • Lastpage
    845
  • Abstract
    A digital background calibration technique for pipelined analog-to-digital converters (ADCs) is proposed to correct the capacitor mismatch, finite dc gain, and nonlinearity of residue amplifiers. It divides the pipelined ADC into two equal channels and changes the decision points of sub-ADCs with a pseudorandom sequence to perform the digital background calibration. The difference between the digital outputs of the channels is used to drive the least mean square (LMS) machine to correct the mentioned errors and also the mismatch between the channels. In order to speed up the error correction, an accurate estimation for the errors is identified. The estimation is done by utilizing a piecewise linear model and a slope mismatch measurement technique in the digital domain. Behavioral simulations of a 12-bit 100-MS/s split pipelined ADC show that the convergence time of the proposed LMS calibration technique is significantly reduced in comparison with the conventional LMS algorithm for the same signal-to-noise-and-distortion ratio.
  • Keywords
    amplifiers; analogue-digital conversion; calibration; error correction; estimation theory; integrated circuit measurement; integrated circuit modelling; least mean squares methods; logic design; piecewise linear techniques; random sequences; LMS algorithm; LMS machine; analog-to-digital converters; capacitor mismatch; digital domain; error correction; finite DC gain; least mean square machine; piecewise linear model; predetermined LMS digital background calibration technique; pseudorandom sequence; residue amplifiers; signal-to-noise-and-distortion ratio; slope mismatch measurement technique; split pipelined ADC; Calibration; Capacitors; Circuits and systems; Convergence; Estimation; Least squares approximations; Transfer functions; Digital background calibration; Split pipelined ADCs; digital background calibration; least mean square (LMS) algorithm; least mean square algorithm; piecewise linear model; piecewise linear model.; split pipelined analog-to-digital converters (ADCs);
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2015.2435071
  • Filename
    7111266