DocumentCode :
742840
Title :
A Closed-Loop \\Sigma \\Delta Interface for a High-Q Micromechanical Capacitive Accelerometer With 200 ng/
Author :
Honglin Xu ; Xiaowei Liu ; Liang Yin
Author_Institution :
MEMS Center, Harbin Inst. of Technol., Harbin, China
Volume :
50
Issue :
9
fYear :
2015
Firstpage :
2101
Lastpage :
2112
Abstract :
In this paper, a fully-differential high-order switched-capacitor (SC) sigma-delta (ΣΔ) interface in a standard 0.5 μm CMOS technology for a micromechanical capacitive accelerometer is presented. A 1 bit digital output is attained by the interface circuit based on a low-noise front-end and a back-end third-order SC ΣΔ modulator, avoiding the use of a separate high-resolution ΣΔ converter to digitize the analog feedback signal. In addition, a micromechanical capacitive sensor element with a high quality factor (high-Q) is used to achieve high-resolution. Furthermore, closed-loop operation and electrical compensation are employed for damping the high-Q to ensure the stability of the high-order system. The sensor consumes 23 mW of power from a single 7 V supply at a sampling clock of 250 kHz. Meanwhile, a sensitivity of 1.896 V/g is achieved with a noise floor of lower than 200 ng /√Hz in low-frequency. The sensor has a nonlinearity of 0.15% with an input range of ±1.2g. The bandwidth (BW) is 300 Hz and the bias instability is 18 μg.
Keywords :
CMOS integrated circuits; Q-factor; accelerometers; capacitive sensors; compensation; feedback; microsensors; sigma-delta modulation; switched capacitor networks; CMOS technology; SC ΣΔ interface; analog feedback signal; back-end third-order SC ΣΔ modulator; bandwidth 300 Hz; bias instability; closed-loop ΣΔ interface; electrical compensation; frequency 250 kHz; fully-differential high-order switched-capacitor sigma-delta ΣΔ interface; high quality factor; high-Q micromechanical capacitive accelerometer; high-order system; high-resolution ΣΔ converter; interface circuit; low-noise front-end SC ΣΔ modulator; micromechanical capacitive sensor element; noise density; power 23 mW; sigma-delta converter; sigma-delta interface; sigma-delta modulator; size 0.5 mum; voltage 7 V; Accelerometers; Capacitance; Capacitors; Modulation; Noise; Noise shaping; Sensors; High quality factor; high-order; interface circuit; micromechanical capacitive accelerometer; sigma-delta modulator;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2015.2428278
Filename :
7112174
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