DocumentCode :
742863
Title :
A Submillimeter Package for Microsystems in High-Pressure and High-Salinity Downhole Environments
Author :
Ma, Yushu ; Yu Sui ; Tao Li ; Gianchandani, Yogesh B.
Author_Institution :
Center for Wireless Integrated MicroSensing & Syst. (WIMS2), Univ. of Michigan, Ann Arbor, MI, USA
Volume :
24
Issue :
4
fYear :
2015
Firstpage :
861
Lastpage :
869
Abstract :
This paper describes a submillimeter-scale package intended for microsystem components in high-pressure and high-salinity environments, such as downhole environments in oil wells. The outer dimensions of the package are 0.8 x 0.8 x 0.8 mm3, whereas the interior cavity is 0.4 x 0.4 x 0.45 mm3. The package consists of a stainless steel 17-4 PH metal can and a borosilicate glass lid, and is hermetically sealed by an Au-In bond. The measured bond strength is ≈13 MPa. A component integration strategy is demonstrated: test silicon chips are assembled into a stack using a folded flexible polyimide cable that provides electrical interconnections among the chips. The packages coated with thin-film alumina by atomic layer deposition and Parylene-C survive >48 h in the American Petroleum Institute standard brine (with 8 wt% NaCl and 2 wt% CaCl2 in deionized water) at 80 °C, and subsequently, in 50-MPa (≈7250 psi) hydraulic pressure.
Keywords :
atomic layer deposition; gold alloys; hermetic seals; indium alloys; micromechanical devices; stainless steel; American Petroleum Institute standard brine; Au-In bond; AuIn; Parylene-C; atomic layer deposition; bond strength; borosilicate glass lid; component integration strategy; electrical interconnections; folded flexible polyimide cable; hermetic seal; high-pressure downhole environments; high-salinity downhole environments; hydraulic pressure; microsystem components; oil wells; stainless steel 17-4 PH metal can; submillimeter package; temperature 80 C; test silicon chips; thin-film alumina; Bonding; Coatings; Glass; Metals; Packaging; Polyimides; Micropackage; gold-indium bond; harsh environment; micro electro-discharge machining;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2014.2355191
Filename :
6905705
Link To Document :
بازگشت