• DocumentCode
    74295
  • Title

    Study on FPGA SEU Mitigation for the Readout Electronics of DAMPE BGO Calorimeter in Space

  • Author

    Zhongtao Shen ; Changqing Feng ; Shanshan Gao ; Deliang Zhang ; Di Jiang ; Shubin Liu ; Qi An

  • Author_Institution
    Dept. of Modern Phys., Univ. of Sci. & Technol. of China, Hefei, China
  • Volume
    62
  • Issue
    3
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    1010
  • Lastpage
    1015
  • Abstract
    The BGO calorimeter, which provides a wide measurement range of the primary cosmic ray spectrum, is a key sub-detector of the Dark Matter Particle Explorer (DAMPE). The readout electronics of calorimeter consists of 16 pieces of Actel ProASIC Plus FLASH-based field-programmable gate array (FPGA), of which the design-level flip-flops and embedded block random access memories (RAM) are single event upset (SEU) sensitive in the harsh space environment. To comply with radiation hardness assurance (RHA), SEU mitigation methods, including partial triple modular redundancy (TMR), CRC checksum, and multi-domain reset are analyzed and tested by the heavy-ion beam test. Composed of multi-level redundancy, a FPGA design with the characteristics of SEU tolerance and low resource consumption is implemented for the readout electronics.
  • Keywords
    cosmic ray apparatus; field programmable gate arrays; flip-flops; particle calorimetry; radiation hardening (electronics); readout electronics; Actel ProASIC Plus; CRC checksum; DAMPE BGO calorimeter; Dark Matter Particle Explorer; FLASH-based field-programmable gate array; FPGA SEU mitigation; RHA; TMR; design-level flip-flops; embedded block random access memories; harsh space environment; heavy-ion beam test; multidomain reset; partial triple modular redundancy; primary cosmic ray spectrum; radiation hardness assurance; readout electronics; single event upset; subdetector; Data acquisition; Field programmable gate arrays; Random access memory; Registers; Reliability; Single event upsets; Tunneling magnetoresistance; FPGA; SEU mitigation;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2015.2427293
  • Filename
    7111378