DocumentCode
74295
Title
Study on FPGA SEU Mitigation for the Readout Electronics of DAMPE BGO Calorimeter in Space
Author
Zhongtao Shen ; Changqing Feng ; Shanshan Gao ; Deliang Zhang ; Di Jiang ; Shubin Liu ; Qi An
Author_Institution
Dept. of Modern Phys., Univ. of Sci. & Technol. of China, Hefei, China
Volume
62
Issue
3
fYear
2015
fDate
Jun-15
Firstpage
1010
Lastpage
1015
Abstract
The BGO calorimeter, which provides a wide measurement range of the primary cosmic ray spectrum, is a key sub-detector of the Dark Matter Particle Explorer (DAMPE). The readout electronics of calorimeter consists of 16 pieces of Actel ProASIC Plus FLASH-based field-programmable gate array (FPGA), of which the design-level flip-flops and embedded block random access memories (RAM) are single event upset (SEU) sensitive in the harsh space environment. To comply with radiation hardness assurance (RHA), SEU mitigation methods, including partial triple modular redundancy (TMR), CRC checksum, and multi-domain reset are analyzed and tested by the heavy-ion beam test. Composed of multi-level redundancy, a FPGA design with the characteristics of SEU tolerance and low resource consumption is implemented for the readout electronics.
Keywords
cosmic ray apparatus; field programmable gate arrays; flip-flops; particle calorimetry; radiation hardening (electronics); readout electronics; Actel ProASIC Plus; CRC checksum; DAMPE BGO calorimeter; Dark Matter Particle Explorer; FLASH-based field-programmable gate array; FPGA SEU mitigation; RHA; TMR; design-level flip-flops; embedded block random access memories; harsh space environment; heavy-ion beam test; multidomain reset; partial triple modular redundancy; primary cosmic ray spectrum; radiation hardness assurance; readout electronics; single event upset; subdetector; Data acquisition; Field programmable gate arrays; Random access memory; Registers; Reliability; Single event upsets; Tunneling magnetoresistance; FPGA; SEU mitigation;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2015.2427293
Filename
7111378
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