DocumentCode
743393
Title
Investigation on Some Parameters Affecting Optical Degradation of LED Packages During High-Temperature Aging
Author
Ming-Yi Tsai ; Chung-Yi Tang ; Wang, C.H. ; Tsai, Y.Y. ; Chun-Hung Chen
Author_Institution
Dept. of Mech. Eng., Chang Gung Univ., Taoyuan, Taiwan
Volume
15
Issue
3
fYear
2015
Firstpage
335
Lastpage
341
Abstract
The mechanism of optical degradation for the light emitting diode (LED) packages in the light bars under the high-temperature aging condition, one of the accelerated life tests, is studied experimentally and numerically. Some parameters, including junction temperature, encapsulant materials, delamination, leadframe surface degradation, and encapsulation, are closely investigated. It is found that the encapsulants (with or without phosphors) and interface delamination have no effect on the optical degradation during the high-temperature aging. On the contrary, junction temperature, leadframe surface degradation, and encapsulation play important roles on this degradation. Optical degradation of the LED packages is found to be mainly caused by silver chloride, which is generated on the leadframe surfaces with an exposure of silver finish in light and heating conditions after interface delamination happening during the high-temperature aging. The high junction temperature could speed up the generation of silver chloride. Moreover, the blue LED package with an encapsulant (silicone) surprisingly give a lower lumen maintenance than one without encapsulant during the high-temperature aging, because of more light absorption on the darkening leadframe surface by total light reflection from silicone encapsulant. Some important parameters affecting the thermal reliability of the LED packages have been identified and the corresponding optical degradation mechanism has been clarified.
Keywords
ageing; electronics packaging; encapsulation; life testing; light emitting diodes; reliability; accelerated life tests; blue LED package; darkening leadframe surface; encapsulant materials; encapsulation; high-temperature aging condition; interface delamination; junction temperature; leadframe surface degradation; light absorption; light bars; light emitting diode packages; lumen maintenance; optical degradation; silicone encapsulant; silver chloride; silver finish; thermal reliability; total light reflection; Aging; Degradation; Lead; Light emitting diodes; Optical reflection; Substrates; Temperature measurement; LED package; optical degradation; reliability; thermal aging;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2015.2441751
Filename
7118453
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