DocumentCode :
74347
Title :
A 0.87 W Transceiver IC for 100 Gigabit Ethernet in 40 nm CMOS
Author :
Hyosup Won ; Taehun Yoon ; Jinho Han ; Joon-Yeong Lee ; Jong-Hyeok Yoon ; Taeho Kim ; Jeong-Sup Lee ; Sangeun Lee ; Kwangseok Han ; Jinhee Lee ; Jinho Park ; Hyeon-Min Bae
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
Volume :
50
Issue :
2
fYear :
2015
fDate :
Feb. 2015
Firstpage :
399
Lastpage :
413
Abstract :
This paper describes a low-power 100 Gigabit Ethernet transceiver IC compliant with IEEE802.3ba 100GBASE-LR4 in 40 nm CMOS. The proposed bidirectional full-duplex transceiver IC contains a total of eight 28 Gb/s CDRs. Each CDR lane incorporates phase-rotator-based delay- and phase-locked loop (D/PLL) architecture for enhanced jitter filtering. All the CDR lanes operate independently while sharing a single voltage-controlled oscillator and supporting referenceless clock acquisition. To reduce power consumption, a multidrop clock distribution scheme with single on-chip transmission-line (T-line) and quadrate RX and TX schemes without CML logic gates are incorporated. Embedded built-in self-test modules featuring a random accumulation jitter generator enables bit error rate (BER) and jitter tolerance self tests without any external equipment. The TX featuring a three-tap pre-emphasis provides a variable output swing ranging from 478 mVppd to 1.06 Vppd. RX equalizers employing a continuous-time linear equalizer and a one-tap decision feedback equalizer compensate for the channel loss up to 25 dB at the Nyquist rate. The measured RX input sensitivity for a BER of 10 -12 is 42 mVppd. The proposed IC consumes only 0.87 W at 28.0 Gb/s with a BER less than 10 -15 on PRBS31 testing. The power efficiency of the proposed transceiver is 3.9 mW/Gb/s, which is the best among the efficiencies achieved by recently published 25 Gb/s transceivers.
Keywords :
automatic testing; clock and data recovery circuits; decision feedback equalisers; error statistics; jitter; local area networks; phase locked loops; transceivers; Ethernet transceiver IC; IEEE802.3ba 100GBASE-LR4; bidirectional full-duplex transceiver IC; bit error rate; continuous-time linear equalizer; embedded built-in self-test modules; enhanced jitter filtering; jitter tolerance self tests; multidrop clock distribution scheme; one-tap decision feedback equalizer; phase-locked loop architecture; phase-rotator-based delay-locked loop; power 0.87 W; power consumption; random accumulation jitter generator; referenceless clock acquisition; single on-chip transmission-line; size 40 nm; voltage-controlled oscillator; Clocks; Generators; Integrated circuits; Jitter; Phase locked loops; Transceivers; Voltage-controlled oscillators; 100 Gigabit Ethernet; Clock and data recovery (CDR); delay- and phase-locked loop (D/PLL); input sensitivity; jitter tolerance (JTOL); jitter transfer (JTRAN); low power; phase rotator; serial link; transceiver;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2014.2369494
Filename :
6973043
Link To Document :
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