DocumentCode :
74369
Title :
Pd/ZnO Nanoparticles Based Schottky Ultraviolet Photodiodes Grown on Sn-Coated n-Si Substrates by Thermal Evaporation Method
Author :
Somvanshi, Divya ; Jit, S.
Author_Institution :
Dept. of Electron. Eng., Indian Inst. of Technol., Varanasi, Varanasi, India
Volume :
20
Issue :
6
fYear :
2014
fDate :
Nov.-Dec. 2014
Firstpage :
120
Lastpage :
125
Abstract :
This paper reports the ultraviolet (UV) detection characteristics of Pd/ZnO nanoparticles (NPs) based Schottky diodes grown on Sn coated n-Si substrates by thermal evaporation method. The measured current-voltage characteristics of the Pd/ZnO NPs/Sn/n-Si diodes under both the dark and UV illumination at wavelength of 365 nm have been presented for the applied bias voltage varying from -3 to 3 V. The as-fabricated photodiodes show a high-contrast ratio (i.e., the photocurrent to dark current ratio) of ~541.34, an excellent quantum efficiency of ~68%, a reasonably good responsivity of ~0.20 A/W at 365 nm, and -3 V reverse bias voltage at room temperature.
Keywords :
II-VI semiconductors; Schottky diodes; dark conductivity; elemental semiconductors; nanoparticles; nanophotonics; palladium; photoconductivity; photodetectors; photodiodes; silicon; tin; ultraviolet detectors; wide band gap semiconductors; zinc compounds; Pd-ZnO-Sn-Si; Schottky ultraviolet photodiodes; Sn-coated n-Si substrates; UV illumination; applied bias voltage; current-voltage characteristics; dark current; dark illumination; high-contrast ratio; nanoparticles; photocurrent; quantum efficiency; responsivity; room temperature; thermal evaporation; ultraviolet detection characteristics; voltage -3 V to 3 V; wavelength 365 nm; Films; Photodiodes; Schottky diodes; Silicon; Substrates; Tin; Zinc oxide; Photodetector; Schottky diodes; ZnO thin film;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2014.2328234
Filename :
6846296
Link To Document :
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