Title :
Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking
Author :
Nikonov, Dmitri E. ; Young, Ian A.
Author_Institution :
Components Res., Intel Corp., Hillsboro, OR, USA
Abstract :
Multiple logic devices are presently under study within the Nanoelectronic Research Initiative (NRI) to carry the development of integrated circuits beyond the complementary metal-oxide-semiconductor (CMOS) roadmap. Structure and operational principles of these devices are described. Theories used for benchmarking these devices are overviewed, and a general methodology is described for consistent estimates of the circuit area, switching time, and energy. The results of the comparison of the NRI logic devices using these benchmarks are presented.
Keywords :
CMOS logic circuits; benchmark testing; integrated circuit testing; logic devices; nanoelectronics; NRI logic devices; Nanoelectronic Research Initiative; benchmarking; beyond CMOS devices; complementary metal oxide semiconductor; integrated circuit testing; Adders; Benchmark testing; CMOS technology; Integrated circuits; Nanoelectronics; Power dissipation; Semiconductor devices; Throughput; Adder; beyond complementary metal–oxide–semiconductor (beyond-CMOS); computational throughput; electronics; integrated circuits; logic; power dissipation; spintronics;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/JPROC.2013.2252317
