Title :
An Embedded 65 nm CMOS Remote Temperature Sensor With Digital Beta Correction and Series Resistance Cancellation Achieving an Inaccuracy of 0.4
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Author :
Xiao Pu ; Ash, Mikel ; Nagaraj, Krishnaswamy ; Joonsung Park ; Vu, Steve ; Kimelman, Paul ; de la Haye, Sean
Author_Institution :
Texas Instrum., Dallas, TX, USA
Abstract :
An embedded remote junction temperature sensor (RTS) with an inaccuracy of 0.4°C (3σ) for temperature range from -40 °C to 130 °C is presented. Using a digital beta compensation technique, series resistance cancellation and global offset and noise coupling cancellation, the sensor is capable of handling a variety of remote BJTs which are either directly mounted on a PCB or embedded in SoCs. It can accommodate a series resistance of more than 500 Ω and beta values down to around 1.5. The RTS has been integrated with a microcontroller core implemented in a 65 nm digital CMOS process. It shares an external reference voltage source with other data converters on the SoC. Measured results from a set of 16 samples and four BJTs are presented.
Keywords :
CMOS digital integrated circuits; bipolar transistors; compensation; intelligent sensors; microcontrollers; printed circuits; system-on-chip; temperature measurement; temperature sensors; BJT; PCB; RTS; SoC; data converter; digital CMOS process; digital beta compensation technique; digital beta correction; embedded CMOS remote temperature sensor; external reference voltage source; microcontroller core; noise coupling cancellation; series resistance cancellation; size 65 nm; temperature -40 degC to 130 degC; temperature 0.4 degC; Clocks; Current measurement; Resistance; Switches; System-on-chip; Temperature measurement; Temperature sensors; Beta correction; series resistance cancellation; sigma-delta modulator; temperature sensor;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2015.2434845