DocumentCode :
743787
Title :
Application of Multiregion Model to EM Scattering From a Dielectric Rough Surface With or Without a Target Above It
Author :
Yi-Wen Wei ; Li-Xin Guo ; An-Qi Wang ; Zhen-sen Wu
Author_Institution :
Sch. of Sci., Xidian Univ., Xian, China
Volume :
61
Issue :
11
fYear :
2013
Firstpage :
5607
Lastpage :
5620
Abstract :
An efficient multiregion model is extended by the single integral equation (SIE) method for the first time to calculate electromagnetic (EM) scattering from a dielectric rough surface with or without a perfectly electric conducting target above it. In the multiregion model, the rough surface is divided into multiple regions depending on their positions along the rough surface and the energy distribution of the incident wave. Two intermediate regions are chosen as the dominant regions in which the method of moment is adopted. If a target is located above the surface, the target is also included in the dominant region. Hence, the new model can markedly reduce the number of unknowns compared with full SIE analysis. Mutual couplings between different regions are approximately considered based on magnetic and electric field integral equations from which closed-form approximations for currents in other regions are derived.
Keywords :
electromagnetic wave scattering; integral equations; rough surfaces; EM scattering; closed-form approximations; dielectric rough surface; electric field integral equations; electromagnetic scattering; energy distribution; incident wave; magnetic field integral equations; multiregion model; perfectly electric conducting target; single integral equation; Dielectrics; Mathematical model; Rough surfaces; Scattering; Surface impedance; Surface roughness; Surface waves; Electromagnetic (EM) scattering; method of moment (MoM); multiregion model; rough surface; single integral equation (SIE);
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2013.2279657
Filename :
6585759
Link To Document :
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