Title :
Wideband Phase Noise Measurement Using a Multifunctional Microwave Photonic Processor
Author :
Dengjian Zhu ; Fangzheng Zhang ; Pei Zhou ; Dan Zhu ; Shilong Pan
Author_Institution :
Key Lab. of Radar Imaging & Microwave Photonics, Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
Abstract :
A novel scheme for measuring the phase noise of microwave signal sources is proposed based on the delay-line method using a multifunctional microwave photonic processor, which can simultaneously implement the electrical-to-optical conversion, provide a time delay, and control the phase of the output microwave signal. Thanks to the microwave photonic processor, the requirement for accurate phase control is relaxed and a large operation bandwidth of the phase noise measurement system can be achieved. An experiment is performed. The phase noise measured by the proposed system agrees well with the result measured by a commercial spectrum analyzer, and the noise floor of the measuring system is lower than -130 dBc/Hz at 10 kHz frequency offset. The large operation bandwidth is also verified by measuring the phase noise of a wideband signal source in a frequency range from 5 to 40 GHz without rebuilding the system.
Keywords :
microwave photonics; noise measurement; optical delay lines; optical noise; optical variables control; optical variables measurement; phase control; phase noise; spectral analysers; commercial spectrum analyzer; delay-line method; electrical-to-optical conversion; frequency 10 kHz; frequency 5 GHz to 40 GHz; large operation bandwidth; measuring system; microwave signal sources; multifunctional microwave photonic processor; noise floor; output microwave signal phase; phase control; phase noise measurement system; time delay; wideband phase noise measurement; wideband signal source; Microwave measurement; Microwave photonics; Noise measurement; Phase measurement; Phase noise; Microwave photonics; phase noise measurement; photonic-delay method;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2014.2358617