Title :
Near Infrared Sensitive Organic Photodiode Utilizing Exciplex Absorption in NdPc2/C60 Heterojunction
Author :
Wenli Lv ; Yingquan Peng ; Junkang Zhong ; Xiao Luo ; Yao Li ; Tingcai Zheng ; Yu Tang ; Lili Du ; Liyuan Peng
Author_Institution :
Sch. of Phys. Sci. & Technol., Lanzhou Univ., Lanzhou, China
Abstract :
Organic photodiodes (OPDs) have been the subject of extensive research due to their inherent advantages of large-area detection, wide range of material selection, and low-cost fabrication. Near infrared (NIR) OPDs were realized mainly by using narrow energy-gap materials and doping organic NIR dyes into the active layer. Here, we report on realization of NIR OPDs by exploiting the exciplex absorption in heterojunction consisting of neodymium phthalocyanine (NdPc2) and C60. For NIR OPDs based on NdPc2/C60 planar heterojunction with C60 thickness of 50 nm, the optimal NdPc2-layer thickness for specific detectivity is 30 nm, while that for photoresponsivity is <;10 nm. A maximal specific detectivity of ~4.46 × 109 Jones was obtained at the optimized NdPc2 layer thickness of 30 nm. At NdPc2 layer thickness of 10 nm, a maximal photoresponsivity of 60 mA/W and a maximal external quantum efficiency of 17% were obtained. The results presented here demonstrate that utilizing exciplex absorption in heterojunction based on NdPc2 and C60 is a prospective route for realizing NIR OPDs.
Keywords :
carbon; dyes; infrared detectors; infrared spectra; light absorption; nanophotonics; optical testing; photodetectors; photodiodes; exciplex absorption; maximal external quantum efficiency; maximal photoresponsivity; narrow energy-gap materials; near infrared sensitive organic photodiode; organic NIR dye doping; size 10 nm; size 30 nm; size 50 nm; Absorption; Heterojunctions; Indium tin oxide; Optical device fabrication; Optical saturation; Optical sensors; Photodiodes; Near infrared; Neodymium phthalocyanine; Organic photodiodes; exciplex; heterojunction; neodymium phthalocyanine; organic photodiodes;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2015.2449631