• DocumentCode
    744577
  • Title

    Photovoltaic Behavior of V2O5/4H-SiC Schottky Diodes for Cryogenic Applications

  • Author

    Di Benedetto, Luigi ; Landi, Giovanni ; Licciardo, Gian Domenico ; Neitzert, Heinz-Christoph ; Bellone, Salvatore

  • Author_Institution
    Dept. of Ind. Eng., Univ. of Salerno, Fisciano, Italy
  • Volume
    3
  • Issue
    5
  • fYear
    2015
  • Firstpage
    418
  • Lastpage
    422
  • Abstract
    The photovoltaic behavior of (divanadioum pentoxide)/(4H polytype silicon carbide) Schottky diodes under ultraviolet illumination and down to 28K is investigated. In addition to their high stability, by using the thermionic model the analysis allows to confirm the predictability of performances at cryogenic temperatures, such as the high light/dark current ratio and the dependence of the photocurrent and open circuit voltage on material parameters. Because of the low-annealing temperature, this structure is shown to be a good candidate for solar-blind photodetectors in the UV spectral range of spatial and terrestrial cryogenic applications.
  • Keywords
    Schottky diodes; annealing; cryogenic electronics; silicon compounds; vanadium compounds; wide band gap semiconductors; 4H polytype silicon carbide; Schottky diodes; V2O5-SiC; cryogenic temperatures; divanadioum pentoxide; high light-dark current ratio; low-annealing temperature; material parameters; open circuit voltage; photocurrent dependence; photovoltaic behavior; thermionic model; ultraviolet illumination; Annealing; Photoconductivity; Photodetectors; Photovoltaic systems; Schottky diodes; Silicon carbide; Temperature measurement; 4H−SiC device; 4H-SiC device; Photodiodes; Photovoltaic effects; Schottky diodes; Silicon compound; photodiodes; photovoltaic effects; schottky diodes; silicon compound;
  • fLanguage
    English
  • Journal_Title
    Electron Devices Society, IEEE Journal of the
  • Publisher
    ieee
  • ISSN
    2168-6734
  • Type

    jour

  • DOI
    10.1109/JEDS.2015.2451097
  • Filename
    7140730