• DocumentCode
    744627
  • Title

    Influence of Periodic Surface Nanopatterning Profiles on Series Resistance in Thin-Film Crystalline Silicon Heterojunction Solar Cells

  • Author

    Abdo, Islam ; Trompoukis, Christos ; Tous, Loic ; Depauw, Valerie ; Guindi, Rafik ; Gordon, Ivan ; El Daif, Ounsi

  • Author_Institution
    imec, Heverlee, Belgium
  • Volume
    5
  • Issue
    5
  • fYear
    2015
  • Firstpage
    1319
  • Lastpage
    1324
  • Abstract
    In the frame of the development of thin crystalline silicon solar cell technologies, surface nanopatterning of silicon is gaining importance. Its impact on the material quality is, however, not yet fully controlled. We investigate here the influence of surface nanotexturing on the series resistance of a contacting scheme relevant for thin-film crystalline silicon heterojunction solar cells. Two-dimensional periodic nanotextures are fabricated using a combination of nanoimprint lithography and either dry or wet etching, while random pyramid texturing is used for benchmarking. We compare these texturing techniques in terms of their effect on the series resistance of a solar cell through a study of the sheet resistance (Rsh) and contact resistance (Rc) of its front layers, i.e., a sputtered transparent conductive oxide and evaporated metal contacts. We have found by four-point probe and the transfer length methods that dry-etched nanopatterns render the highest Rsh and Rc values. Wet-etched nanopatterns, on the other hand, have less impact on Rc and render Rsh similar to that obtained from the nontextured case.
  • Keywords
    contact resistance; etching; nanolithography; nanopatterning; silicon; solar cells; Si; contact resistance; crystalline silicon solar cells; dry etching; four point probe; heterojunction solar cells; nanoimprint lithography; periodic surface nanopatterning profiles; random pyramid texturing; series resistance; sheet resistance; thin film solar cells; transfer length method; wet etching; Indium tin oxide; Photovoltaic cells; Silicon; Substrates; Surface resistance; Surface treatment; Crystalline silicon; four-point probe; inverted pyramids; light trapping; nanoimprint; surface texturing; thin-film solar cells; transfer length method (TLM);
  • fLanguage
    English
  • Journal_Title
    Photovoltaics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    2156-3381
  • Type

    jour

  • DOI
    10.1109/JPHOTOV.2015.2447831
  • Filename
    7145385