DocumentCode
744627
Title
Influence of Periodic Surface Nanopatterning Profiles on Series Resistance in Thin-Film Crystalline Silicon Heterojunction Solar Cells
Author
Abdo, Islam ; Trompoukis, Christos ; Tous, Loic ; Depauw, Valerie ; Guindi, Rafik ; Gordon, Ivan ; El Daif, Ounsi
Author_Institution
imec, Heverlee, Belgium
Volume
5
Issue
5
fYear
2015
Firstpage
1319
Lastpage
1324
Abstract
In the frame of the development of thin crystalline silicon solar cell technologies, surface nanopatterning of silicon is gaining importance. Its impact on the material quality is, however, not yet fully controlled. We investigate here the influence of surface nanotexturing on the series resistance of a contacting scheme relevant for thin-film crystalline silicon heterojunction solar cells. Two-dimensional periodic nanotextures are fabricated using a combination of nanoimprint lithography and either dry or wet etching, while random pyramid texturing is used for benchmarking. We compare these texturing techniques in terms of their effect on the series resistance of a solar cell through a study of the sheet resistance (Rsh) and contact resistance (Rc) of its front layers, i.e., a sputtered transparent conductive oxide and evaporated metal contacts. We have found by four-point probe and the transfer length methods that dry-etched nanopatterns render the highest Rsh and Rc values. Wet-etched nanopatterns, on the other hand, have less impact on Rc and render Rsh similar to that obtained from the nontextured case.
Keywords
contact resistance; etching; nanolithography; nanopatterning; silicon; solar cells; Si; contact resistance; crystalline silicon solar cells; dry etching; four point probe; heterojunction solar cells; nanoimprint lithography; periodic surface nanopatterning profiles; random pyramid texturing; series resistance; sheet resistance; thin film solar cells; transfer length method; wet etching; Indium tin oxide; Photovoltaic cells; Silicon; Substrates; Surface resistance; Surface treatment; Crystalline silicon; four-point probe; inverted pyramids; light trapping; nanoimprint; surface texturing; thin-film solar cells; transfer length method (TLM);
fLanguage
English
Journal_Title
Photovoltaics, IEEE Journal of
Publisher
ieee
ISSN
2156-3381
Type
jour
DOI
10.1109/JPHOTOV.2015.2447831
Filename
7145385
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