DocumentCode :
744823
Title :
Mean shift: a robust approach toward feature space analysis
Author :
Comaniciu, Dorin ; Meer, Peter
Author_Institution :
Imaging & Visualization Dept., Siemens Corp. Res. Inc., Princeton, NJ, USA
Volume :
24
Issue :
5
fYear :
2002
fDate :
5/1/2002 12:00:00 AM
Firstpage :
603
Lastpage :
619
Abstract :
A general non-parametric technique is proposed for the analysis of a complex multimodal feature space and to delineate arbitrarily shaped clusters in it. The basic computational module of the technique is an old pattern recognition procedure: the mean shift. For discrete data, we prove the convergence of a recursive mean shift procedure to the nearest stationary point of the underlying density function and, thus, its utility in detecting the modes of the density. The relation of the mean shift procedure to the Nadaraya-Watson estimator from kernel regression and the robust M-estimators; of location is also established. Algorithms for two low-level vision tasks discontinuity-preserving smoothing and image segmentation - are described as applications. In these algorithms, the only user-set parameter is the resolution of the analysis, and either gray-level or color images are accepted as input. Extensive experimental results illustrate their excellent performance
Keywords :
computer vision; estimation theory; image segmentation; nonparametric statistics; pattern clustering; smoothing methods; Nadaraya-Watson estimator; algorithm performance; analysis resolution; arbitrarily shaped cluster delineation; color images; complex multimodal feature space; computational module; convergence; density function; density modes detection; discontinuity-preserving image smoothing; discrete data; gray-level images; image segmentation; kernel regression; location estimation; low-level vision algorithms; mean shift; nearest stationary point; nonparametric technique; pattern recognition procedure; recursive mean shift procedure; robust M-estimators; robust feature space analysis; user-set parameter; Convergence; Density functional theory; Image analysis; Image color analysis; Image resolution; Image segmentation; Kernel; Pattern recognition; Robustness; Smoothing methods;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.1000236
Filename :
1000236
Link To Document :
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