DocumentCode
745095
Title
Cascaded Bayesian inferencing for switching activity estimation with correlated inputs
Author
Bhanja, Sanjukta ; Ranganathan, Nagarajan
Author_Institution
Univ. of South Florida, Tampa, FL, USA
Volume
12
Issue
12
fYear
2004
Firstpage
1360
Lastpage
1370
Abstract
In this paper, we investigate the estimation of switching activity in VLSI circuits using a graphical probabilistic model based on cascaded Bayesian networks (CBNs). First, we develop a theoretical analysis for Bayesian inferencing of switching activity and then derive upper bounds for certain circuit parameters which, in turn, are useful in establishing the cascade structure of the CBN model. We formulate an elegant framework for maintaining probabilistic consistency in the interfacing boundaries across the CBNs during the inference process using a tree-dependent (TD) probability distribution function. A TD distribution is an approximation of the true joint probability function over the switching variables, with the constraint that the underlying BN representation is a tree. The tree approximation of the true joint probability function can be arrived at by using a maximum weight spanning tree (MWST) built using pairwise mutual information about the switching occurring at pairs of signal lines on the boundary. Further, we show that the proposed TD distribution function can be used to model correlations among the primary inputs which is critical for accuracy in modeling of switching activity. Experimental results for ISCAS circuits are presented to illustrate the efficacy of the proposed CBN models.
Keywords
Bayes methods; VLSI; approximation theory; belief networks; boundary-value problems; cascade networks; circuit complexity; circuit switching; electronic engineering computing; estimation theory; inference mechanisms; statistical analysis; statistical distributions; trees (mathematics); ISCAS circuits; VLSI circuits; cascaded Bayesian inference methods; cascaded Bayesian networks; circuit complexity; circuit parameters; correlation inputs; graphical probabilistic model; maximum weight spanning tree; pairwise mutual information; probability distribution function; switching activity estimation; switching activity modeling; switching variables; tree approximation; tree dependent distribution; true joint probability function; upper bounds; Bayesian methods; Combinational circuits; Delay estimation; Mutual information; Parameter estimation; Probability distribution; Random variables; Switching circuits; Upper bound; Very large scale integration; Bayesian inferencing; dynamic power dissipation; power estimation; switching activity;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2004.837991
Filename
1407954
Link To Document