VCO phase-noise improvement by gate-finger configuration of 0.13-μm CMOS transistors

Author

Chien-Chih Ho ; Gong-Hao Liang ; Chi-Feng Huang ; Yi-Jen Chan ; Chih-Sheng Chang ; Chih-Ping Chao

Author_Institution

Dept. of Electr. Eng., Nat. Central Univ., Chung-li, Taiwan

Volume

26

Issue

4

fYear

2005

fDate

4/1/2005 12:00:00 AM

Firstpage

258

Lastpage

260

Abstract

Using a standard logic process, 0.13-μm RF CMOS devices with multifinger gate structure have been fabricated. The flicker noise and minimum noise figure characteristics have been investigated with different gate layout splits, where the device parasitic resistance is the determining factor in this issue. The stripe-shaped gate configuration demonstrates better noise performance, due to the reduction of device gate resistance. In addition, the MOS varactors designed with different gate layouts were used in a 5.2-GHz voltage-controlled oscillator (VCO) design, where the VCO with the stripe-shaped (2 μm × 36 fingers) gate varactor improved about 6 dB in phase-noise performance at 100-kHz offset frequency than that of square-shaped (8 μm × 9 fingers) gate varactor.

Keywords

CMOS integrated circuits; MIS devices; MOSFET; flicker noise; microwave oscillators; phase noise; semiconductor device noise; varactors; voltage-controlled oscillators; 0.13 micron; 0.13-/spl mu/m CMOS transistors; 0.13-/spl mu/m RF CMOS device; 100 kHz; 5.2 GHz; 5.2-GHz voltage-controlled oscillator; 6 dB; MOS varactors; MOSFET; VCO phase-noise improvement; device gate resistance; device parasitic resistance; flicker noise; gate layout splits; gate-finger configuration; minimum noise figure; multifinger gate structure; standard logic process; stripe-shaped gate configuration; stripe-shaped gate varactor; 1f noise; CMOS logic circuits; CMOS process; Fingers; Logic devices; Noise figure; Noise reduction; Radio frequency; Varactors; Voltage-controlled oscillators; Flicker noise; MOSFET; phase noise; voltage-controlled oscillator (VCO);

fLanguage

English

Journal_Title

Electron Device Letters, IEEE

Publisher

ieee

ISSN

0741-3106

Type

jour

DOI

10.1109/LED.2005.844700

Filename

1408035