DocumentCode :
74567
Title :
Split gate resurf stepped oxide UMOSFET with P-pillar for improved performance
Author :
Wang Ying ; Hu Haifan ; Wang Liguo ; Yu Chenghao
Author_Institution :
Coll. of Inf. & Commun. Eng., Harbin Eng. Univ., Harbin, China
Volume :
7
Issue :
4
fYear :
2014
fDate :
Apr-14
Firstpage :
965
Lastpage :
972
Abstract :
In this work, the authors propose a split-gate resurf stepped oxide with P-pillar (SGRSOP) UMOS structure. The P-pillar trench under the source electrode in SGRSOP U-shape metal-oxide-semiconductor (UMOS) serves the purpose of simultaneously achieving the following: (1) it has formed a local super junction (SJ) structure with the N-type drift. The P-pillar modulates the electric field distribution in the local SJ and increases the N- drift region doping concentration. (2) It has suppressed the parasitic bipolar junction transistor (BJT) effect by adding the P-pillar in the N- drift region, enlarges the boundary of the snapback. As compared with the SGRSO UMOS, the SGRSOP UMOS only add the P-pillar structure, while it has the better performance. The simulation results show that the SGRSOP UMOS reduces the on-state specific resistance (RSP) and increases the transconductance (gm), improves the figure of merit and its UIS ruggedness is as good as that of the split-gate resurf stepped oxide UMOS.
Keywords :
bipolar transistors; power MOSFET; semiconductor doping; N- drift region doping concentration; P-pillar; RSP; SGRSOP; UMOS structure; electric field distribution; local super junction structure; on-state specific resistance; parasitic BJT effect suppression; performance improvement; power MOSFET; source electrode; split gate resurf stepped oxide UMOSFET; split-gate resurf stepped oxide UMOS; transconductance;
fLanguage :
English
Journal_Title :
Power Electronics, IET
Publisher :
iet
ISSN :
1755-4535
Type :
jour
DOI :
10.1049/iet-pel.2013.0363
Filename :
6786926
Link To Document :
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