Comparative study on electrical performance of normal and superconducting multiconductor lines for high-speed interconnects and uniplanar MICs

Author

Wu, K. ; Tripathi, V.K. ; Stubbs, M. ; Bosisio, R.G.

Author_Institution

Dept. de Genie Electr., Ecole Polytech. de Montreal, Que., Canada

Volume

142

Issue

1

fYear

1995

fDate

2/1/1995 12:00:00 AM

Firstpage

71

Lastpage

74

Abstract

A comparative study of electrical performance is made between normal and superconducting multiple conductors, for applications in high-speed, high-density VLSI interconnects and uniplanar MICs. The self-consistent electromagnetic analysis is presented, which can handle the multiconductors as normal dielectrics, with high real or complex conductivity in the electromagnetic simulation. Examples of interconnecting lines and multiple uniplanar waveguides are shown for dispersion and losses. Extremely low losses and dispersion of superconducting multiple lines, over a very wide frequency range, demonstrate promising potential for high-speed interconnects

Keywords

VLSI; high-temperature superconductors; integrated circuit interconnections; microwave integrated circuits; superconducting interconnections; transmission line theory; transmission lines; complex conductivity; dielectrics; dispersion; electrical performance; electromagnetic analysis; electromagnetic simulation; high-density VLSI interconnects; high-speed interconnects; interconnecting lines; losses; multiple uniplanar waveguides; normal multiconductor lines; real conductivity; superconducting multiconductor lines; uniplanar MIC; very wide frequency range;

fLanguage

English

Journal_Title

Microwaves, Antennas and Propagation, IEE Proceedings

Publisher

iet

ISSN

1350-2417

Type

jour

DOI

10.1049/ip-map:19951640

Filename

368712