DocumentCode :
745975
Title :
A high-voltage output driver in a 2.5-V 0.25-μm CMOS technology
Author :
Serneels, Bert ; Piessens, Tim ; Steyaert, Michiel ; Dehaene, Wim
Author_Institution :
ESAT-MICAS Lab., Katholieke Univ. Leuven, Belgium
Volume :
40
Issue :
3
fYear :
2005
fDate :
3/1/2005 12:00:00 AM
Firstpage :
576
Lastpage :
583
Abstract :
The design of a high-voltage output driver in a digital 0.25-μm 2.5-V technology is presented. The use of stacked devices with a self-biased cascode topology allows the driver to operate at three times the nominal supply voltage. Oxide stress and hot carrier degradation is minimized since the driver operates within the voltage limits imposed by the design rules of a mainstream CMOS technology. The proposed high-voltage architecture uses a switching output stage. The realized prototype delivers an output swing of 6.46 V to a 50-Ω load with a 7.5-V supply and an input square wave of 10 MHz. A PWM signal with a dual-tone sinusoid at 70 kHz and 250 kHz results in an IM3 of -65 dB and an IM2 of -67 dB. The on-resistance is 5.9 Ω.
Keywords :
CMOS digital integrated circuits; buffer circuits; driver circuits; high-voltage techniques; hot carriers; 0.25 micron; 10 MHz; 2.5 V; 250 kHz; 50 ohm; 6.46 V; 7.5 V; 70 kHz; CMOS integrated circuits; PWM signal; buffer circuits; dual-tone sinusoid; high-voltage output driver; high-voltage techniques; hot carrier degradation; nominal supply voltage; oxide stress; self-biased cascode topology; stacked devices; switching output stage; CMOS process; CMOS technology; Circuit topology; Costs; Degradation; Driver circuits; Integrated circuit technology; Pulse width modulation; Transistors; Voltage; Buffer circuits; CMOS integrated circuits; high-voltage techniques;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2005.843599
Filename :
1408077
Link To Document :
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