Title :
Stability improvement of an optical receiver making use of a focused ion beam apparatus
Author :
Verbeke, J. ; Vandewege, J. ; van Doorselaer, K. ; Vetter, Peter ; De Pestel, G.
Author_Institution :
Dept. of Inf. Technol., Ghent Univ.
fDate :
3/2/1995 12:00:00 AM
Abstract :
The reliability of a receiver chip, designed to be used in a fibre-in-board electro-optical link, is improved by providing the second stage of the postamplifier with a Schmitt trigger. These modifications are realised on the chip using a focused ion beam apparatus
Keywords :
bipolar analogue integrated circuits; circuit stability; focused ion beam technology; integrated circuit reliability; optical receivers; trigger circuits; FIB; Schmitt trigger; fibre-in-board electro-optical link; focused ion beam apparatus; optical receiver; postamplifier second stage; receiver chip; reliability; stability improvement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19950260
