Title :
Yield and cost model for integrated optical chips
Author :
März, Reinhard ; Mahlein, Hans F. ; Acklin, Bruno
Author_Institution :
Res. Labs., Siemens AG, Munich, Germany
fDate :
2/1/1996 12:00:00 AM
Abstract :
A yield and cost model for integrated optical chips is presented on the basis of easily attainable figures. It allows a prediction to be made of yield and cost for complex optical chips on the basis of currently available processing technology. Both yield and cost area of calculated in absolute terms but in comparison with a simple reference chip from the production line. The model can already be applied when a chip is at an early phase of development, i.e., at the planning stage
Keywords :
integrated circuit modelling; integrated circuit yield; integrated optoelectronics; integrated optical chip cost model; integrated optical chip yield; planning stage; processing technology; production line; reference chip; Cost function; Integrated circuit yield; Integrated optics; Manufacturing processes; Microelectronics; Predictive models; Production; Semiconductor device modeling; Virtual manufacturing; Wafer scale integration;
Journal_Title :
Lightwave Technology, Journal of
