DocumentCode :
746386
Title :
Analysis of new high-voltage bipolar Silicon-On-Insulator transistor with fully depleted collector
Author :
Arnborg, T. ; Litwin, Andrej
Author_Institution :
Ericsson Components AB, Stockholm, Sweden
Volume :
42
Issue :
1
fYear :
1995
fDate :
1/1/1995 12:00:00 AM
Firstpage :
172
Lastpage :
177
Abstract :
A new type of high voltage bipolar transistor for implementation in SOI material (Silicon-On-Insulator) has been developed. It is shown by measurements on fabricated structures and by numerical device simulations that the current drive capability of such a transistor is comparable to what has been achieved in a conventional transistor with buried layer and plug or in any optimized lateral transistor with buried emitter and collector layers. The new type of transistor designed in a few micrometer thick silicon layer has a breakdown voltage BVCEO in excess of several hundreds volts and also a remarkably high Early voltage of about 400 volts. This unique Early voltage is also explained in detail by a new analytical model. The transistor is expected to have a strong impact on the feasibility to realize mixed analog and digital signal circuits with high and low voltage functions on the same chip
Keywords :
electric breakdown; power bipolar transistors; semiconductor device models; silicon-on-insulator; 400 V; Early voltage; breakdown voltage; current drive capability; fabricated structure measurements; fully depleted collector; high-voltage bipolar SOI transistor; mixed analog and digital signal circuits; numerical device simulations; Analytical models; Bipolar transistors; Current measurement; Dielectric substrates; Insulation; Numerical simulation; Plugs; Silicon on insulator technology; Voltage; Wafer bonding;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.370020
Filename :
370020
Link To Document :
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