DocumentCode :
74644
Title :
Analysis of Current Transport Mechanisms in GaAsN Homojunction Solar Cell Grown by Chemical Beam Epitaxy
Author :
Bouzazi, Boussairi ; Kojima, Nobuhiko ; Ohshita, Yoshio ; Yamaguchi, Masaki
Author_Institution :
Semicond. Lab., Toyota Technol. Inst., Nagoya, Japan
Volume :
3
Issue :
2
fYear :
2013
fDate :
Apr-13
Firstpage :
909
Lastpage :
915
Abstract :
Current transport mechanisms were investigated in a GaAsN homojunction solar cell (HJSC) grown by chemical beam epitaxy. At each temperature of measurement, the current-voltage ( I-V-T) characteristics were found to deviate from the diffusion model. The fitting of these characteristics affirmed that the recombination current in the space-charge region of the HJSC is mainly attributed to a localized state at 0.31 eV below the bottom edge of the conduction band of GaAsN. This recombination center was identified by deep-level transient spectroscopy. It was previously confirmed to act as a nitrogen-related nonradiative recombination center, and the split interstitial formed from one nitrogen atom and one arsenic atom in a single V-site (N-As)As was tentatively suggested to be its possible origin. The lifetime of electrons from the conduction band to its energy level was calculated to be around ~0.20 ns, using the Shockley-Read-Hall model for a trap-assisted recombination process. Furthermore, such order of magnitude was confirmed by time-resolved photoluminescence measurements.
Keywords :
III-V semiconductors; carrier lifetime; chemical beam epitaxial growth; conduction bands; deep level transient spectroscopy; diffusion; gallium arsenide; gallium compounds; interstitials; localised states; photoluminescence; semiconductor epitaxial layers; semiconductor growth; solar cells; space-charge-limited conduction; time resolved spectra; wide band gap semiconductors; GaAsN; I-V-T characteristics; Shockley-Read-Hall model; chemical beam epitaxy; conduction band; current transport mechanisms; current-voltage characteristics; deep-level transient spectroscopy; diffusion model; electron lifetime; electron volt energy 0.31 eV; energy level; homojunction solar cell; interstitial; localized state; nitrogen-related nonradiative recombination center; recombination current; space-charge region; time-resolved photoluminescence measurements; trap-assisted recombination process; Electron traps; Gallium arsenide; Metals; Photovoltaic cells; Spontaneous emission; Temperature; Temperature measurement; Chemical beam epitaxy; GaAsN; current–voltage (I–V); deep-level transient spectroscopy (DLTS); recombination center; time-resolved photoluminescence (TR-PL);
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2013.2244160
Filename :
6472006
Link To Document :
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