Title :
Compacting test responses for deeply embedded SoC cores
Author :
Sinanoglu, Ozgur ; Orailoglu, Alex
Author_Institution :
Univ. of California, USA
Abstract :
Test bandwidth allocation issues greatly limit the parallel testing of SoC cores. Here, the authors propose a response compaction methodology for reducing the required output core bandwidth, enabling increased parallelism among core tests and hence reducing the overall SoC test time.
Keywords :
built-in self test; digital integrated circuits; fault diagnosis; integrated circuit testing; system-on-chip; SoC cores; aliasing analysis; compaction circuitry; diagnosis support; fault-model independent compaction; heuristic; output core bandwidth; parallel testing; Bandwidth; Channel allocation; Circuit faults; Circuit testing; Compaction; Embedded computing; Operating systems; Parallel processing; Time sharing computer systems; Transportation;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1214349
