• DocumentCode
    746465
  • Title

    Compacting test responses for deeply embedded SoC cores

  • Author

    Sinanoglu, Ozgur ; Orailoglu, Alex

  • Author_Institution
    Univ. of California, USA
  • Volume
    20
  • Issue
    4
  • fYear
    2003
  • Firstpage
    22
  • Lastpage
    30
  • Abstract
    Test bandwidth allocation issues greatly limit the parallel testing of SoC cores. Here, the authors propose a response compaction methodology for reducing the required output core bandwidth, enabling increased parallelism among core tests and hence reducing the overall SoC test time.
  • Keywords
    built-in self test; digital integrated circuits; fault diagnosis; integrated circuit testing; system-on-chip; SoC cores; aliasing analysis; compaction circuitry; diagnosis support; fault-model independent compaction; heuristic; output core bandwidth; parallel testing; Bandwidth; Channel allocation; Circuit faults; Circuit testing; Compaction; Embedded computing; Operating systems; Parallel processing; Time sharing computer systems; Transportation;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1214349
  • Filename
    1214349
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=746465