DocumentCode :
746835
Title :
Characterization of MEMS transducer performance using near-field scanning interferometry
Author :
Blackshire, James L. ; Sathish, S.
Author_Institution :
Center for Mater. Diagnostics, Dayton Univ., OH, USA
Volume :
49
Issue :
5
fYear :
2002
fDate :
5/1/2002 12:00:00 AM
Firstpage :
669
Lastpage :
674
Abstract :
Sophisticated ultrasonic transducer microarrays based on micro-electro-mechanical-systems (MEMS) technologies are quickly becoming a reality. A current challenge for many researchers is characterizing the dynamic performance of these and other micro-mechanical devices. In this work, the performance characteristics of a MEMS ultrasonic transducer array were successfully measured using a scanning heterodyne interferometer system. The dynamic response of the entire transducer array was measured, and the results were compared with theoretical predictions. Individual elements were found to vibrate with Bessel-like displacement patterns, and they were resonant at approximately 4 MHz. The full array showed variations in peak out-of-plane displacement levels across the device of /spl sim/16%, and isolated elements that were dramatically over-responsive and under-responsive. The measured variations across the array may have an undesirable impact on the performance of the transducer and its radiated field.
Keywords :
Bessel functions; displacement measurement; dynamic response; light interferometry; micromechanical resonators; ultrasonic transducer arrays; Bessel-like displacement patterns; MEMS transducer performance; dynamic performance; dynamic response; near-field scanning interferometry; scanning heterodyne interferometer system; surface displacement measurements; surface motions; ultrasonic transducer microarrays; vibrations; Biomembranes; Fabrication; Interferometry; Micromechanical devices; Piezoelectric transducers; Ultrasonic imaging; Ultrasonic transducer arrays; Ultrasonic transducers; Ultrasonic variables measurement; Voltage; Elasticity; Electric Capacitance; Electrodes; Equipment Failure Analysis; Interferometry; Light; Membranes, Artificial; Miniaturization; Motion; Nanotechnology; Sensitivity and Specificity; Transducers; Ultrasonics;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2002.1002467
Filename :
1002467
Link To Document :
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