DocumentCode :
746850
Title :
Precise extraction of emitter resistance from an improved floating collector measurement
Author :
Morizuka, Kouhei ; Hidaka, Osamu ; Mochizuki, Hiroshi
Author_Institution :
Mater. & Devices Lab., Toshiba Res. & Dev. Center, Kawasaki, Japan
Volume :
42
Issue :
2
fYear :
1995
fDate :
2/1/1995 12:00:00 AM
Firstpage :
266
Lastpage :
273
Abstract :
A distributed transistor model is developed which comprehensively explains the non-linear characteristics of floating collector measurements. The non-linearity is attributed to the fact that the intrinsic collector current is not zero when the collector terminal is opened. Based on this understanding, a new procedure to extract emitter resistance is proposed. Combining the measurements of forward and reverse current gains and intrinsic base sheet resistance, the ambiguity in the conventional floating collector measurement is diminished and hence the accuracy is significantly improved
Keywords :
bipolar transistors; electric resistance measurement; equivalent circuits; semiconductor device models; semiconductor device testing; distributed transistor model; emitter resistance extraction; floating collector measurement; forward current gain; intrinsic base sheet resistance; nonlinear characteristics; reverse current gain; Bipolar transistors; Current measurement; Current-voltage characteristics; Diodes; Electrical resistance measurement; Gain measurement; Helium; Proximity effect; Region 4; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.370070
Filename :
370070
Link To Document :
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