• DocumentCode
    746853
  • Title

    Quantum modeling and proposed designs of CNT-embedded nanoscale MOSFETs

  • Author

    Akturk, Akin ; Pennington, Gary ; Goldsman, Neil

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
  • Volume
    52
  • Issue
    4
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    577
  • Lastpage
    584
  • Abstract
    We propose a novel MOSFET design that embodies single-wall zigzag semiconducting carbon nanotubes (CNTs) in the channel. Investigations show that CNTs have high low-field mobilities, which can be as great as 1 × 105 cm2/V·s. Thus, we expect that MOSFET performance can be improved by embedding CNTs in the channel. To investigate the performance of a newly proposed CNT-MOSFET device, we develop a methodology that connects CNT modeling to MOSFET simulations. Our calculations indicate that by forming high mobility regions in the channel, MOSFET performance can be boosted. However, barriers formed between the CNT and silicon due to the variations of the bandgaps and electron affinities can degrade MOSFET performance improvements. Our calculations were obtained by building on our existing CNT Monte Carlo simulator , and quantum-based device solver ,.
  • Keywords
    MOSFET; Monte Carlo methods; carbon nanotubes; carrier mobility; electron affinity; semiconductor device models; silicon; CNT Monte Carlo simulator; CNT modeling; CNT-MOSFET device; CNT-embedded MOSFET design; CNT-embedded nanoscale MOSFET; MOSFET simulation; Si; carbon nanotubes mobility model; electron affinity; high mobility region; low-field mobility; quantum modeling; quantum-based device solver; single-wall zigzag semiconducting carbon nanotubes; Carbon nanotubes; Electric variables; Electron mobility; Equations; MOSFETs; Monte Carlo methods; Photonic band gap; Semiconductivity; Silicon; Wrapping; CNT-embedded MOSFET design; Carbon nanotubes (CNT) mobility model; simulation; single-wall zigzag CNT;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.845148
  • Filename
    1408161