DocumentCode :
747026
Title :
2008 IEEE International Integrated Reliability Workshop
Volume :
8
Issue :
2
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
435
Lastpage :
435
Abstract :
Provides a listing of upcoming conference events of interest to practitioners and researchers.
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2008.926660
Filename :
4539823
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=747026