• DocumentCode
    747143
  • Title

    Field-plate engineering for HFETs

  • Author

    Karmalkar, Shreepad ; Shur, Michael S. ; Simin, Grigory ; Khan, M.Asif

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., Madras, India
  • Volume
    52
  • Issue
    12
  • fYear
    2005
  • Firstpage
    2534
  • Lastpage
    2540
  • Abstract
    This paper reports on the analytical approach for designing field plates for reducing the electric field in the channel and at the surface of heterostructure field-effect transistors (HFETs) for a given drain voltage, with the smallest possible increase of the gate capacitance. The analytical calculations for GaN-based HFETs are in good agreement with the two-dimensional numerical simulations.
  • Keywords
    III-V semiconductors; capacitance; electric fields; gallium compounds; high electron mobility transistors; numerical analysis; plates (structures); semiconductor device models; GaN; HFET; channel; drain voltage; electric field reduction; field plate engineering; gate capacitance; heterostructure field effect transistor; numerical simulation; Capacitance; Dielectric constant; Dielectrics and electrical insulation; Doping; HEMTs; Helium; MODFETs; Numerical simulation; Polarization; Voltage; Analytical modeling; field plate; heterostructure field effect transistor (HFET);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.859568
  • Filename
    1546312