• DocumentCode
    747350
  • Title

    Optimal doping profiles via geometric programming

  • Author

    Joshi, Siddharth ; Boyd, Stephen ; Dutton, Robert W.

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., CA, USA
  • Volume
    52
  • Issue
    12
  • fYear
    2005
  • Firstpage
    2660
  • Lastpage
    2675
  • Abstract
    We first consider the problem of determining the doping profile that minimizes base transit time in a (homojunction) bipolar junction transistor. We show that this problem can be formulated as a geometric program, a special type of optimization problem that can be transformed to a convex optimization problem, and therefore solved (globally) very efficiently. We then consider several extensions to the basic problem, such as accounting for velocity saturation, and adding constraints on doping gradient, current gain, base resistance, and breakdown voltage. We show that a similar approach can be used to maximize the cutoff frequency, taking into account junction capacitances and forward transit time. Finally, we show that the method extends to the case of heterojunction bipolar junction transistors, in which the doping profile, as well as the profile of the secondary semiconductor, are to be jointly optimized.
  • Keywords
    bipolar transistors; convex programming; doping profiles; geometric programming; heterojunction bipolar transistors; base resistance; base transit time minimization; breakdown voltage; convex optimization problem; current gain; cutoff frequency maximization; doping gradient; geometric programming; heterojunction bipolar junction transistors; homojunction bipolar junction transistor; optimal doping profiles; velocity saturation; Capacitance; Contracts; Cutoff frequency; Doping profiles; Frequency response; Helium; Heterojunction bipolar transistors; Iterative methods; Optimization methods; Semiconductor process modeling; Base doping profile; Ge-profile optimization; base transit time minimization; cutoff frequency maximization; geometric programming; optimal doping profile;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.859649
  • Filename
    1546330