DocumentCode
747350
Title
Optimal doping profiles via geometric programming
Author
Joshi, Siddharth ; Boyd, Stephen ; Dutton, Robert W.
Author_Institution
Dept. of Electr. Eng., Stanford Univ., CA, USA
Volume
52
Issue
12
fYear
2005
Firstpage
2660
Lastpage
2675
Abstract
We first consider the problem of determining the doping profile that minimizes base transit time in a (homojunction) bipolar junction transistor. We show that this problem can be formulated as a geometric program, a special type of optimization problem that can be transformed to a convex optimization problem, and therefore solved (globally) very efficiently. We then consider several extensions to the basic problem, such as accounting for velocity saturation, and adding constraints on doping gradient, current gain, base resistance, and breakdown voltage. We show that a similar approach can be used to maximize the cutoff frequency, taking into account junction capacitances and forward transit time. Finally, we show that the method extends to the case of heterojunction bipolar junction transistors, in which the doping profile, as well as the profile of the secondary semiconductor, are to be jointly optimized.
Keywords
bipolar transistors; convex programming; doping profiles; geometric programming; heterojunction bipolar transistors; base resistance; base transit time minimization; breakdown voltage; convex optimization problem; current gain; cutoff frequency maximization; doping gradient; geometric programming; heterojunction bipolar junction transistors; homojunction bipolar junction transistor; optimal doping profiles; velocity saturation; Capacitance; Contracts; Cutoff frequency; Doping profiles; Frequency response; Helium; Heterojunction bipolar transistors; Iterative methods; Optimization methods; Semiconductor process modeling; Base doping profile; Ge-profile optimization; base transit time minimization; cutoff frequency maximization; geometric programming; optimal doping profile;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2005.859649
Filename
1546330
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